SPM Scanning Probe Microscopes
Scanning Probe Microscopy (SPM) was the first technology that allowed the direct observation of atoms. Today, it is still one of the most diffused techniques for surface characterisation.
Atomic Force Microscopes (AFM) and Scanning Tunnelling Microscopes (STM) are essential equipment for accurate topographic, three-dimensional measurements on micrometer and sub-micrometer scales.
Atomic Force Microscopes (AFM) and Scanning Tunnelling Microscopes (STM) are essential equipment for accurate topographic, three-dimensional measurements on micrometer and sub-micrometer scales.
Products of this Category
Products beloging to this category
- XE BIO
- XE 100 AFM
- SPM1000
- XE 70 AFM
- EasyScan 2
- XE-NSOM
- XE 150 AFM
- UHV SPM
- EasyPLL Plus
- Nanite - Mountable AFM