Coatings Characterisation: thickness and Elemental Analysis
Thickness and Elemental Analysis of Industrial Coatings
X- Ray Fluorescence technology allows the measurement of thickness as well as Elemental Analysis of materials in such industrial processes as: Galvanization, Anodizing, Plating, Electroplating.
The above mentioned processes are extensively exploited in the industry owing to low production cost, durability, absence of service and corrosion resistance.
X-ray Fluorescence makes it possible to perform measurements of all elements between Na and U, up to four deposition layers and the substrate material, as well as composition analysis of galvanic baths and alloys.
Our XRF complies with standard measurement methods like: ISO 3497, ASTM B 568 and DIN 50987.
X- Ray Fluorescence technology allows the measurement of thickness as well as Elemental Analysis of materials in such industrial processes as: Galvanization, Anodizing, Plating, Electroplating.
The above mentioned processes are extensively exploited in the industry owing to low production cost, durability, absence of service and corrosion resistance.
X-ray Fluorescence makes it possible to perform measurements of all elements between Na and U, up to four deposition layers and the substrate material, as well as composition analysis of galvanic baths and alloys.
Our XRF complies with standard measurement methods like: ISO 3497, ASTM B 568 and DIN 50987.
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